Infra-red profilometer

Details Infra-red profilometer Infra-red profilometer

G - Physics

01

B

73/112, 350/3

G01B 11/00 (2006.01) G01C 7/00 (2006.01) G01C 11/00 (2006.01)

Patent

CA 1075931

ABSTRACT OF THE DISCLOSURE An apparatus and method for determining the three- dimensional surface profile of the charge or burden in a furnace. A pair of infra-red radiation measuring instruments receives infra-red rays from temperature-characterized points on the surface and generates temperature-position signals for the points. Signals generated by a first instrument are paired with the signals generated by the second instrument that correspond to identical temperature-characterized points. The position in space of each temperature-characterized point is determined from the known relative positions of the instruments and the two position components of the paired signals.

273855

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