Infrared measuring device, especially for the spectrometry...

Details Infrared measuring device, especially for the spectrometry... Infrared measuring device, especially for the spectrometry...

G - Physics

01

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G01N 21/43 (2006.01) A47K 1/00 (2006.01) A47K 11/00 (2006.01) E03D 11/13 (2006.01) E03D 13/00 (2006.01) G01J 3/00 (2006.01) G01J 3/12 (2006.01) G01N 21/05 (2006.01) G01N 21/35 (2006.01) G01N 21/55 (2006.01) G01N 33/02 (2006.01) G01N 33/48 (2006.01) G01N 35/00 (2006.01) G01J 3/42 (2006.01) G01J 3/45 (2006.01)

Patent

CA 2480739

The invention relates to an infrared measuring device, especially for the spectrometry of aqueous systems. Said device comprises at least one measuring unit, especially a measuring cell, also comprising at least one ATR-body and at least one infrared light source. The measuring unit contains at least one ATR-body which comprises at least two planar, substantially parallel limiting surfaces and which is transparent with respect to measuring radiation and which has an index of refraction which is greater than that of the medium which is arranged next to at least one limiting surface and which is to be examined, especially larger or equal to 1.5. The IR-measuring radiation on at least one of the planar, parallel limiting surfaces of the ATR-body can be totally reflected in an attenuated manner by at least six times.

L'invention concerne un dispositif de mesure à infrarouge conçu en particulier pour la spectrométrie de systèmes aqueux. Ce dispositif comprend au moins une unité de mesure, en particulier une cellule de mesure, qui comporte au moins un corps ATR et au moins une source lumineuse infrarouge. L'invention est caractérisée en ce que cette unité de mesure renferme au moins un corps ATR qui comporte au moins deux surfaces limites planes sensiblement parallèles, est transparent au rayonnement de mesure et présente un indice de réfraction supérieur à celui d'un milieu à examiner se trouvant à côté d'au moins une surface limite, en particulier supérieur ou égal à 1,5. Le rayonnement de mesure à infrarouge peut être réfléchi au moins six fois selon le principe de la réflexion totale atténuée (ATR), sur au moins une des surfaces limites planes parallèles du corps ATR.

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