G - Physics – 01 – J
Patent
G - Physics
01
J
73/52
G01J 5/02 (2006.01)
Patent
CA 1319832
ABSTRACT The invention is concerned with an infrared radiation probe for measuring the temperature at the sur- face of an object by measurement of the infrared radiation emitted from the surface. The infrared radiation probe according to the invention has a head positionable in spaced relation to the object surface and comprising at least one angularly inclined reflective surface having a predetermined surface area and disposed at an angle relative to the object surface such as to define with the object surface a wedge-shaped reflective cavity for increasing effective emissivity of the object surface by multiple reflections, and a bundle of optical fibers having a predetermined angular aperture at a radiation receiving end connected to the probe head and arranged for collecting the infrared radiation reflected from within the cavity and transmitting the reflected infrared radia- tion to radiation detector means adapted to convert the infrared radiation into a signal representative of the surface temperature of the object. The angular aperture of the optical fiber bundle, the angle defined by the reflec- tive surface and the surface area thereof are such as to substantially prevent stray radiation from being transmit- ted through the optical fibers. The infrared radiation probe according to the invention is particularly useful for measuring the temperature of low-emissivity materials in a production line.
571689
Belanger Christian
Cielo Paolo
Krapez Jean-Claude
Belanger Christian
Cielo Paolo
Krapez Jean-Claude
National Research Council Of Canada
Ogilvy Renault Llp/s.e.n.c.r.l.,s.r.l.
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