G - Physics – 01 – N
Patent
G - Physics
01
N
349/42
G01N 29/04 (2006.01) G01N 29/22 (2006.01) G01N 29/26 (2006.01)
Patent
CA 1222314
ABSTRACT OF THE DISCLOSURE For the inspection of a square billet, an ultra- sonic testing by angle beam technique is performed using phased array systems, and the phased array probe is dis- posed in a plane perpendicular to axial direction of a square billet and at a prescribed distance from surface of the billet and set at a prescribed angle with respect to the billet surface, and the billet is inspected at inside and surface layer when the ultrasonic beam is electronically. Inspection of surface layer is performed using surface defect inspection apparatus or the like, and discrimination of defect of inside region including subsurface region is performed based on subtraction of information of ultrasonic inspection by information of surface defect inspection.
444221
Aburatani Kenji
Iwasaki Masayoshi
Miyake Kazuo
Ooshiro Takehiko
Sahara Kousuke
Kabushiki Kaisha Kobe Seiko Sho
Riches Mckenzie & Herbert Llp
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