G - Physics – 01 – N
Patent
G - Physics
01
N
G01N 21/90 (2006.01) G01B 11/02 (2006.01) G01N 21/47 (2006.01) G01N 21/89 (2006.01) G06F 15/70 (1990.01)
Patent
CA 2114510
A technique for detecting defects in stationary products or in products moving on a production line (102, FIG 1) by analyzing area of interest (AOIs) of their modified images uses a matrix or linescan camera (104, FIG 1) for taking images of products (102). The product's dimensions are measured with accuracy, and the existence and alignment of caps and seals is determined. The technique is much faster and more accurate than current techniques and is based up on an analysis of the AOIs and their discontinuities. (209 FIG 1). Carefully selected AOIs of the modified image (2 to 8, FIG 2) are saved in the memory of a computer (106, FIG 1). The method also includes loading look-up tables to modify the gray levels of the products; saving AOIs in memory to be analyzed (FIG 1); analyzing AOI data, counting pixel discontinuities, etc. The results can be used to measure product ovality, check caps and seals on products, and check changes of fluid or content levels in containers.
Schwartz Nira
Shahar Arie
Woods Richard
Gowling Lafleur Henderson Llp
Schwartz Nira
Shahar Arie
Woods Richard
LandOfFree
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