Inspection probe having thin metal wires with self resiliency

Details Inspection probe having thin metal wires with self resiliency Inspection probe having thin metal wires with self resiliency

H - Electricity

01

L

356/198, 324/58,

H01L 21/66 (2006.01) G01R 1/073 (2006.01) G01R 31/04 (2006.01)

Patent

CA 2037823

An inspection probe which allows a plurality of such inspection probes to be arranged at a remarkably reduced pitch. The inspection probe comprises a very thin metal wire having a diameter of 120 µm or less and so shaped as to have self resiliency, and a plated noble metal layer formed on a surface of the very thin wire. A probe pin head for the inspection of an electronic circuit board is constructed employing a plurality of such inspection probes. The inspection probes are secured to or embedded in a base made of a resin material. A process of producing the probe pin head is also disclosed.

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