Inspection system

G - Physics – 01 – B

Patent

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G01B 9/08 (2006.01) G01R 13/20 (2006.01) G01R 13/22 (2006.01)

Patent

CA 1152739

ABSTRACT OF THE DISCLOSURE In inspection systems that inspect the good or bad of objects such as electrical circuits or the like by observing wave forms of characteristics of the objects which appear on a picture screen of a Braun tube oscillo- scope, the wave forms being provided by sweeping the electrical characteristics of objects in relation with time, the inspection system having an optical sensor which generates outputs by sensing the light from the picture screen and an optical mask which practically prevents the passage of light from the picture screen, the optical mask having a shape in response with the standard wave form for the electrical characteristics of the above mentioned inspected object, and being placed at a predetermined positioned on the picture screen.

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