Integrated circuit characterisation system and method

Details Integrated circuit characterisation system and method Integrated circuit characterisation system and method

G - Physics

01

R

G01R 31/319 (2006.01) G01R 31/3193 (2006.01)

Patent

CA 2638379

There is presented a system and method for characterizing an integrated circuit (IC) for comparison with a pre-defined system-level characteristic related to an aspect of IC operation, wherein a test procedure on the IC that invokes this aspect is executed, while at least one operational bottleneck is invoked to constrain operation of the IC to exhibit a system-level operation thereof related to the aspect. Data generated via the test procedure in response to the bottleneck is collected and the system-level operation exhibited thereby is compared for consistency with the pre-defined system-level characteristic.

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