Integration of low-k polymers into interlevel dielectrics...

H - Electricity – 01 – L

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H01L 21/312 (2006.01) H01L 21/768 (2006.01) H01L 51/40 (2006.01)

Patent

CA 2284760

A process for the preparation of substrates used in the manufacture of integrated circuits wherein spin-on low dielectric constant (low-k) polymer films are applied on semiconductor substrates. A non-etchback processing of spin-on low-k polymer films, without losing the low dielectric constant feature of the film, especially inbetween metal lines, is achieved utilizing electron beam radiation. A polymeric dielectric film (7, 8) is applied and dried onto a substrate and exposed to electron beam radiation under conditions sufficient to partially cure the dielectric layer. The exposing forms a relatively more hardened topmost portion (8) of the dielectric layer and a relatively less hardened underlying portion (7) of the dielectric layer.

Ce procédé de préparation de substrats utilisés dans la fabrication de circuits intégrés consiste à appliquer par centrifugation des films polymères à constante diélectrique faible sur des substrats semi-conducteurs. On traite lesdits films -sans gravure par retrait-, sans perdre la caractéristique de constante diélectrique faible de ceux-ci notamment dans l'espace situé entre les lignes métalliques, au moyen d'un rayonnement par faisceau électronique. On applique un film diélectrique polymère (7, 8) sur un substrat, on sèche le film sur le substrat et on l'expose au rayonnement d'un faisceau électronique, dans des conditions suffisantes pour que se produise un durcissement partiel de la couche diélectrique. La partie exposée de la couche diélectrique forme une portion supérieure relativement durcie (8) et une portion sous-jacente relativement moins durcie (7).

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