Interconnect assembly for a probe card

G - Physics – 01 – R

Patent

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Details

G01R 1/073 (2006.01) G01R 31/28 (2006.01)

Patent

CA 2583218

An interconnect assembly for providing electrical interconnection between elements of a probe card assembly is provided. The interconnect assembly includes a frame defining a plurality of openings and a plurality of conductive contacts coupled to the frame. Each of the conductive contacts includes (a) a first resilient arm extending away from a first surface of the frame and (b) a second resilient arm extending away from a second surface of the frame. At least one of the first resilient arm or the second resilient arm extends through one of the plurality of openings.

L~invention concerne un ensemble d~interconnexion permettant de réaliser une interconnexion électrique entre des éléments d~un ensemble à carte sonde. L~ensemble d~interconnexion comporte un cadre définissant une pluralité d~ouvertures et une pluralité de contacts conducteurs couplés au cadre. Chacun des contacts conducteurs comporte (a) un premier bras élastique s~éloignant d~une première surface du cadre, et (b) un deuxième bras élastique s~éloignant d~une deuxième surface du cadre. Au moins un des premier et deuxième bras élastiques traverse l~une des ouvertures de la pluralité d~ouvertures.

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