G - Physics
01
B
33/49
G01B 9/02 (2006.01) G01B 11/02 (2006.01) G01B 11/30 (2006.01) G01D 5/26 (2006.01) G01P 13/04 (2006.01)
Patent
CA 1163094
PHN.9846 15 1.9.1981 ABSTRACT: "Interferometer". An interferometer for various uses is described. In the interferometer an interference line pattern is formed at the location of a multiple photo-cell, whose individual photo-diodes are consecutively connected to an electronic signal-processing circuit by an electronic switch. Changes in the measuring arm of the interferometer can be measured with high accuracy.
385900
N.v. Philips Gloeilampenfabrieken
Van Steinburg C.e.
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