Interferometer spectrophotometer

Details Interferometer spectrophotometer Interferometer spectrophotometer

G - Physics

01

N

73/55

G01N 21/27 (2006.01) G01B 9/02 (2006.01) G01J 3/453 (2006.01)

Patent

CA 1210608

INTERFEROMETER SPECTROMETER Abstract An interferometer spectrometer having a source of analytical radiation, optical elements forming a Michelson- type interferometer operative on the radiation, the optical elements including a beam splitter and movable reflecting member, and a system for gauging the position of the movable reflecting member. The gauging system employs quadrature phase discrimination to provide signals indicative of the position and direction of movement of that portion of the movable reflecting member within the analytical radiation path. In a preferred embodiment, the quadrature phase discrimination system has an optical path that is generally coaxial with at least that portion of the analytical radiation path at the movable reflecting member. Multiple quadrature phase discrimination systems may be employed to provide an indication of the position and direction of movement of three portions of a flat movable reflecting member, one of which portions may be within the analytical radiation path at the reflecting surface of the reflecting member. The gauging system may further provide an initial reference indicative of the position of the movable reflecting member independently of the beam splitter and may include an additional quadrature phase discrimination system. The reference system may be employed redundantly to provide an indication of position and direction of movement of the movable reflecting member.

441961

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