C - Chemistry – Metallurgy – 07 – H
Patent
C - Chemistry, Metallurgy
07
H
195/1.12, 150/8.
C07H 21/00 (2006.01) C12Q 1/68 (2006.01)
Patent
CA 2023888
The present invention provides a method for detection of at least one allele of a genetic locus and can be used to provide direct determination of the haplotype. The method comprises amplifying genomic DNA with a primer pair that spans an intron sequence and defines a DNA sequence in genetic linkage with an allele to be detected. The primer-defined DNA sequence contains a sufficient number of intron sequence nucleotides to characterize the allele. Genomic DNA is amplified to produce an amplified DNA sequence characteristic of the allele. The amplified DNA sequence is analyzed to detect the presence of a genetic variation in the amplified DNA sequence such as a change in the length of the sequence, gain or loss of a restriction site or substitution of a nucleotide. The variation is characteristic of the allele to be detected and can be used to detect remote alleles. Kits comprising one or more of the reagents used in the method are also described.
Genetic Technologies Limited
Simons Malcolm J.
Smart & Biggar
LandOfFree
Intron sequence analysis method for detection of adjacent... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Intron sequence analysis method for detection of adjacent..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Intron sequence analysis method for detection of adjacent... will most certainly appreciate the feedback.
Profile ID: LFCA-PAI-O-1600980