Ion trap mass spectrometer system and method

Details Ion trap mass spectrometer system and method Ion trap mass spectrometer system and method

H - Electricity

01

J

H01J 49/42 (2006.01) H01J 49/04 (2006.01) H01J 49/26 (2006.01)

Patent

CA 2148331

This invention relates generally to an ion trap mass spectrometer for analyzing ions and more particularly to a substantially quadrupole ion trap mass spectrometer with an enlarged ion occupied volume. Described herein are electrode geometries that enlarge the ion occupied volume. Improved ion sensitivities, detection limits and dynamic range should be realized for the same charge density in these devices because the increased ion occupied volume allows for the storage of a greater number of ions. The essence of this invention is that these ion trap geometries may apply all modes of operation of substantially quadrupole ion traps such as the mass selective instability mode, resonance excitation/ejection, and MS".

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