Ionization chamber for measuring the profile of a radiation...

Details Ionization chamber for measuring the profile of a radiation... Ionization chamber for measuring the profile of a radiation...

G - Physics

01

T

358/34

G01T 1/29 (2006.01) H01J 47/02 (2006.01)

Patent

CA 1221774

ABSTRACT OF THE DISCLOSURE An ionization chamber for measuring the profile of a radiation field (R) is provided which comprises a first electrode (8) and a second electrode (10) arranged parallel to each other, both electrodes (8, 10) forming a gap (12) therebetween. A shield (14) made of a material opaque to ions produced by the radiation field (R) is movably arranged in said gap (12). It contains an aperture (16) which forms a measuring volume between said electrodes (8, 10). The ionization chamber further comprises means (24) for slideably moving the shield (14) along the gap (12). Thereby, the radiation profile can be measured.

467877

Affiliated with

Also associated with

Rating

Ionization chamber for measuring the profile of a radiation... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Ionization chamber for measuring the profile of a radiation..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Ionization chamber for measuring the profile of a radiation... will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFCA-PAI-O-1176294