G - Physics – 01 – R
Patent
G - Physics
01
R
356/188, 356/2
G01R 31/26 (2006.01) G01R 31/3185 (2006.01) H01L 21/66 (2006.01) H01L 27/02 (2006.01)
Patent
CA 1102008
ABSTRACT OF THE DISCLOSURE A large scale integrated circuit with external integral access test circuitry having a semiconductor body with a surface. A large scale integrated circuit is formed in the semiconductor body through the surface and comprises a large number of interconnected circuit elements with a large number of input and output pads connected to the cir- cuit elements and disposed near the outer perimeter of the semiconductor body. An integrated test circuit is formed in the semiconductor body and extends through the surface. The integrated test circuit has a plurality of probe pads carried by the semiconductor body and connected to the test circuit. The integrated test circuit is formed external of but in relatively close proximity to the large scale inte- grated circuit. Leads are provided on the semiconductor body which connect the integrated test circuit to the large scale integrated circuit whereby access can be obtained to the large scale integrated circuit through probing of the probe pads of the integrated test circuit to ascertain the characteristics of the large scale integrated circuit.
304469
Buelow Fred K.
Zasio John J.
Fujitsu Limited
Mcfadden Fincham
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