G - Physics – 01 – N
Patent
G - Physics
01
N
G01N 15/10 (2006.01) G01N 15/00 (2006.01) G01N 27/62 (2006.01) H01J 49/04 (2006.01) H01J 49/16 (2006.01) H01J 49/40 (2006.01)
Patent
CA 2167100
The present invention provides methods and apparatus for analyzing the particulate contents of a sample such that a high proportion of the sample particles are analyzed without discrimination against high electronegativity and high ionization potential elements. In an exemplary embodiment, the invention comprises an apparatus for analyzing the particulate content of a sample having particulate diameters in a range of 0.001-10 microns. The apparatus comprises an evacuable chamber equipped with a chamber entrance through which a particle-laden gas stream enters. An inlet device, such as a capillary, communicates with the chamber entrance for inputting the particle- laden gas stream to the evacuable chamber. A laser is positioned to produce a focused laser beam which intersects the particle-laden gas stream at a position approximately 0.1 mm from the chamber entrance. The laser beam has a power density sufficient to fragment and ionize particles entrained within the particle-laden gas stream. A detector is positioned to detect the ionized species produced by the laser.
At&t Ipm Corp.
Kirby Eades Gale Baker
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