Laser scanner flaw detection system using baseline follower...

Details Laser scanner flaw detection system using baseline follower... Laser scanner flaw detection system using baseline follower...

G - Physics

01

N

340/123.3

G01N 21/01 (2006.01) G01N 21/89 (2006.01)

Patent

CA 1043883

A B S T R A C T The output of the detector of a laser scanner flaw detection system is processed to treat changes therein which are not related to the detection of flaws. Detector output is applied to a baseline extractor providing a moving average baseline signal which is fed with the detector output in one mode to a differential circuit producing a difference signal which is applied to a discriminator. In an alternative mode, the detector output is applied directly to the discriminator. The baseline extractor is coupled to a thres- hold circuit which is coupled to the discriminator. Signals from the dif- ferential circuit or from the detector are passed by the discriminator if they exceed a predetermined threshold to provide a flaw output. A clamp cir- cuit is also provided for removing ambient light on the detector from the detector output signal.

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