Lever arm for a scanning microscope

G - Physics – 01 – Q

Patent

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Details

G01Q 70/16 (2010.01) G01Q 70/08 (2010.01)

Patent

CA 2302739

The invention relates to a method for producing a lever arm with a tip for a scanning microscope. The invention also relates to one such lever arm. In order to produce said lever arm, a piezo-resistive resistance can be implanted in a wafer with a tip using C-MOS. A metal coating covering the tip is then applied to the wafer if the tip should be protected in the next step or if a photo-enamel could be damaged in the next step. The metal is selected in such a way that it can be wet-chemically etched. The lever arm and the tip consist of a single piece unlike prior art. A piezo-resistive resistance is located underneath an oxide coating in the lever arm. One advantage of the invention is that the tip does not need to be glued by hand, as is the case for prior art, despite use of the C-MOS method.

L'invention concerne un procédé de production d'un bras levier doté d'une pointe et destiné à un microscope à balayage. L'invention concerne également un tel bras de levier. Pour la production d'un tel bras levier, on peut implanter une résistance piézorésitive dans une tranche présentant une pointe au moyen d'un CMOS. Ensuite, on applique sur la tranche une couche métallique qui recouvre la pointe si la pointe doit être protégée à l'étape suivante ou si une photolaque risque d'être entièrement endommagée par la suite. Contrairement à l'état de la technique, le bras de levier et la pointe sont conçus d'une seule pièce. Le bras de levier comporte, sous une couche d'oxyde, une résistance piézorésistive. Malgré le procédé CMOS, la pointe ne doit avantageusement pas être collée ultérieurement à la main comme c'est le cas selon l'état de la technique.

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