Linear displacement and strain measuring apparatus

G - Physics – 01 – L

Patent

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Details

G01L 1/00 (2006.01) G01B 7/16 (2006.01)

Patent

CA 2070738

Linear displacement and strain measuring apparatus includes a linearly movable element, an emitter disposed on the movable element to move as the element is moved, for developing predetermined patterns of electric fields which vary linearly on the emitter in the direction of movement of the element, and a detector disposed in close proximity to the emitter adjacent the path in which moves to detect variations in the electric field patterns as the emitter is moved, for producing output signals representing variation in the electric field patterns and thus the linear displacement of the movable element relative to the detector. By attaching the movable element and the detector to spaced apart locations on a specimen, strain in the specimen can be measured.

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