Linearizing circuit for a non-destructive testing instrument...

G - Physics – 01 – R

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324/59

G01R 15/10 (1980.01)

Patent

CA 1129006

LINEARIZING CIRCUIT FOR A NON-DESTRUCTIVE TESTING INSTRUMENT HAVING A DIGITAL DISPLAY Abstract of the Disclosure A linearizing circuit is provided for a non- destructive testing instrument having circuit means developing a DC voltage having a non-linear relationship to units of measurement or of conductivity or some other characteristic measure. A plurality of linearizing stages are provided each including an adjustable resistance con- nected between a reference voltage source and an output line when the potential of the output line is between the reference voltage and one limit of the DC voltage. Prefer- ably, an analog switch is provided in series with the adjustable resistance and is controlled from an operational amplifier, with a second operational amplifier being pro- vided having an output connected through the analog switch and the adjustable resistance to the output line. The circuit is very accurate and reliable and is readily adjusted by a method wherein the resistances are adjusted in accordance with reference voltages in a certain sequence to obtain accurate adjustment with no juggling operation.

342523

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