Long wavelength x-ray diffractometer

G - Physics – 01 – N

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

358/11.4

G01N 23/207 (2006.01)

Patent

CA 1262781

ABSTRACT: Long wavelength X-ray diffractometer. A long wavelength diffractometer is provided with an X-ray tube providing long wavelength radiation to a pre-sample monochromometer which diffracts X-radiation onto a sample. The use of long wavelength X-radiation allows measurement of "d" values of about 2 times greater than normal with very low intrinsic background.

525628

LandOfFree

Say what you really think

Search LandOfFree.com for Canadian inventors and patents. Rate them and share your experience with other people.

Rating

Long wavelength x-ray diffractometer does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Long wavelength x-ray diffractometer, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Long wavelength x-ray diffractometer will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFCA-PAI-O-1202650

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.