G - Physics – 01 – N
Patent
G - Physics
01
N
358/11.4
G01N 23/207 (2006.01)
Patent
CA 1262781
ABSTRACT: Long wavelength X-ray diffractometer. A long wavelength diffractometer is provided with an X-ray tube providing long wavelength radiation to a pre-sample monochromometer which diffracts X-radiation onto a sample. The use of long wavelength X-radiation allows measurement of "d" values of about 2 times greater than normal with very low intrinsic background.
525628
Jenkins Ronald
Nicolosi Joseph
Fetherstonhaugh & Co.
Jenkins Ronald
Nicolosi Joseph
North American Philips Corporation
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