H - Electricity – 01 – H
Patent
H - Electricity
01
H
H01H 1/00 (2006.01)
Patent
CA 2592507
An improved dielectric suitable for use in electronic and micro-electro- mechanical (MEMS) components. The dielectric includes silicon nitride having a percentage of Si:H bonds greater than a percentage of N:H bonds, in order to reduce the level of charge trapping of the silicon nitride.
L~invention concerne un diélectrique amélioré approprié pour être utilisé dans des composants électroniques et micro-électromécaniques (MEMS). Le diélectrique comprend du nitrure de silicium dans lequel le pourcentage de liaisons Si:H est supérieur à un pourcentage de liaisons N:H, afin de réduire le niveau de piégeage de charges dans le nitrure de silicium.
Cramer Harlan C.
Desalvo Gregory C.
Dix Gilbert E.
Horner Jeremiah J.
Horner Robert J.
Northrop Grumman Corporation
Osler Hoskin & Harcourt Llp
LandOfFree
Low charging dielectric for capacitive mems devices and... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Low charging dielectric for capacitive mems devices and..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Low charging dielectric for capacitive mems devices and... will most certainly appreciate the feedback.
Profile ID: LFCA-PAI-O-1535569