G - Physics – 01 – N
Patent
G - Physics
01
N
G01N 27/72 (2006.01) G01R 33/028 (2006.01) G01R 33/12 (2006.01)
Patent
CA 2443248
Apparatus and methods are disclosed which provide increased sensitivity, selectivity and dynamic range for non-contact measurement of actual physical and/or kinematic properties of conducting and magnetic materials. The apparatus and methods are based upon various methods for increasing sensitivity, selectivity and dynamic range through proper construction of a magnetometer sensor and for proper selection of operating point parameters for the application. A measurement apparatus for measuring one or more MUT properties includes an electromagnetic winding structure which, when driven by an electric signal, imposes a magnetic field in the MUT and senses and electromagnetic response. An analyzer is provided for applying the electric signal to the winding structure. A property estimator is coupled to the winding structure and translates sensed electromagnetic responses into estimates of one or more preselected properties of the material.
Goldfine Neil J.
Melcher James R.
Massachusetts Institute Of Technology
Norton Rose Or S.e.n.c.r.l. S.r.l./llp
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