Magnetometer of increased sensitivity, selectivity and...

G - Physics – 01 – N

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G01N 27/72 (2006.01) G01R 33/12 (2006.01)

Patent

CA 2125138

Apparatus and methods are disclosed which provide increased sensitivity, selectivity, and dynamic range for noncontact measurement of actual physical and/or kinematic properties of conducting and magnetic materials. The apparatus and methods are based upon various methods for increasing sensitivity, selectivity and dynamic range through proper construction of a magnetometer sensor and for proper selection of operating point parameters for the application. A measurement apparatus for measuring one or more MUT (12) properties includes an electromagnetic winding structure (2) which, when driven by an electric signal, imposes a magnetic field in the MUT (12) and senses an electromagnetic response. An analyzer (14) is provided for applying the electric signal to the winding structure. A property estimator (26) is coupled to the winding structure and translates sensed electromagnetic responses into estimates of one or more preselected properties of the material.

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