Mass spectrometer beam monitor

Details Mass spectrometer beam monitor Mass spectrometer beam monitor

G - Physics

21

K

358/9

G21K 1/00 (2006.01) H01J 49/02 (2006.01) H01J 49/16 (2006.01) H01J 49/32 (2006.01)

Patent

CA 1081867

ABSTRACT OF THE DISCLOSURE The ion beam from a field desorption source in a disabling the electric sector of the mass analyzer such that double focusing magnetic mass spectrometer is monitored by the ion beam is not deflected. An opening is provided in the wall of the electric sector such that the undeflected ion beam may pass therethrough to a detector. This permits the characteristics of the field desorption source to be ascer- tained more quickly and easily so that a mass analysis may be performed. The monitor may be operated automatically to vary a characteristic of the field desorption source until ions are detected. Thereafter, the electric sector is ener- gized and an analysis performed.

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