Mass spectrometer with improved mass accuracy

H - Electricity – 01 – J

Patent

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Details

H01J 49/42 (2006.01)

Patent

CA 2486451

Mass spectrometers, and methods and apparatus, including computer program products, for operating the same, implement techniques for measuring mass of one or more analyte ions with high mass accuracy. The techniques include a calibration procedure that includes multiple calibration steps to account for system non-linearities. Components of a control system can be disposed in a thermally-controlled environment on a printed circuit board.

La présente invention concerne des spectromètres de masse, des procédés et des appareils, y compris des produits programmes informatiques, conçus pour faire fonctionner ces spectromètres, qui mettent en oeuvre des techniques de mesure de masse sur un ou plusieurs ions à analyser avec une grande précision de masse. Ces techniques comprennent une opération d'étalonnage comprenant plusieurs étapes d'étalonnage permettant de tenir compte des non linéarités du système. Des composants d'un système de commande peuvent être placés dans un environnement à commande thermique sur une carte de circuits imprimés.

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