Mass spectrometry method and apparatus

Details Mass spectrometry method and apparatus Mass spectrometry method and apparatus

H - Electricity

01

J

H01J 49/42 (2006.01) H01J 3/40 (2006.01) H01J 49/06 (2006.01) H01J 49/10 (2006.01)

Patent

CA 2689088

A mass spectrometer comprises an ion source for supplying sample ions for analysis, a linear ion trap, a deflection lens and an electrostatic trap mass analyzer. The linear ion trap extends between an entrance end for receiving sample ions and an axially opposed exit end through which sample ions are released and travel along a first axis. The deflection lens is positioned downstream in the ion path from the linear ion trap and deflects the sample ions along a second axis displaced from the first axis. The electrostatic trap mass analyzer is positioned downstream of the deflection lens for mass analyzing the sample ions. Sample ions having high energies are prevented from streaming from the linear ion trap to the electrostatic trap mass analyzer.

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