Material fault detector

Details Material fault detector Material fault detector

G - Physics

01

N

G01N 21/89 (2006.01) B07C 5/04 (2006.01)

Patent

CA 2108940

ABSTRACT A system for detecting faults in a material that is carried by a conveyor is provided, comprising a light source such as a scanning laser that is reflected by a rotating mirror onto the material, a beam scattering mechanism positioned on an opposite side of the material from the scanning laser, and an array of photodiodes positioned to detect light scattered by the beam scattering mechanism. Rapid changes in the amount of light reaching the array of photodiodes are detected when a defect is present thereby producing an electronic defect signal having a different waveform for different types of defects. The electronic defect signal is analyzed to identify the type of defect, and the material is sorted according to the type of defect. According to a second aspect of the present invention, a method for detecting faults in a material that is carried by a conveyor is provided comprising the steps of scanning a beam of light on and partially through the material, detecting high rate changes in intensity of the portion of the beam of light passing through the material, counting the number of high rate changes in intensity detected, and sorting the material according to the number counted.

Affiliated with

Also associated with

Rating

Material fault detector does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Material fault detector, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Material fault detector will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFCA-PAI-O-1619824