G - Physics – 01 – N
Patent
G - Physics
01
N
73/58, 340/124.5
G01N 21/00 (2006.01)
Patent
CA 1084296
ABSTRACT OF THE DISCLOSURE A property of a sheet material, such as a thin, infrared radiation-transmissive film of plastic or the like with specular surfaces is measured with substantial freedom from errors caused by wave interference effects, utilizing a radiation source for generating infrared radiation having a wavelength subject to absorption in the sheet material. Beams of the radiation are directed from a multiplicity of points as on the diffusively reflective inner surface of a sphere to a surface of the sheet material at a broad spectrum of incidence angles. Radiation leaving the sheet material is intercepted and redirected to a surface of the sheet material. The radiation is directed and redirected by reflective surface elements forming an enclosing configuration which substantially confines a surface area of the sheet material. A primary reflector is located within the enclosing configuration, and a primary beam of radiation from the source is directed onto the primary reflector so that the reflective surface elements at the beam-directing points are illuminated by infrared radiation reflected from the primary reflector. A portion of the radiations which have left the sheet material are detected and a response indicative of the sheet property is produced as a function of the detected radiation.
336296
Pugh John F.
Williams Paul
Accuray Corporation
Macrae & Co.
LandOfFree
Measurement of thin films minimizing wave interference effects does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Measurement of thin films minimizing wave interference effects, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Measurement of thin films minimizing wave interference effects will most certainly appreciate the feedback.
Profile ID: LFCA-PAI-O-893516