Measurement station for highly shining faces

G - Physics – 01 – B

Patent

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G01B 11/25 (2006.01)

Patent

CA 2715345

The invention relates to a method for measuring a profile of a reflective surface of a workpiece, in particular a reflective surface of a pipe section end (2), in that an electrical field is generated between suspended particles (19) suspended in the ambient air of the surface and the surface, as a result of which field the particles (19) are attracted to the surface and mat the surface by being deposited on the latter, and the matt surface is then scanned with a laser beam (16) and scattered light (17) reflected by the matt surface is measured using a sensor (11) and the profile of the surface is thus determined.

L'invention concerne un procédé de mesure du profil d'une surface réfléchissante d'une pièce, en particulier d'une surface réfléchissante d'une extrémité de tronçon de tube (2). Selon ce procédé, on produit, entre la surface et des particules en suspension (19) flottant dans l'air environnant de la surface, un champ électrique par lequel les particules (19) sont attirées vers la surface et rendent la surface mate en se déposant sur elle, la surface rendue mate est ensuite balayée par un faisceau laser (16), on mesure au moyen d'un capteur (11) la lumière diffuse (17) réfléchie par la surface rendue mate, et on détermine ainsi le profil de la surface.

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