Measuring apparatus and method employing hard x-rays

Details Measuring apparatus and method employing hard x-rays Measuring apparatus and method employing hard x-rays

G - Physics

01

N

358/11

G01N 23/08 (2006.01) G21K 1/10 (2006.01)

Patent

CA 1244150

ABSTRACT OF THE DISCLOSURE A measuring apparatus employing hard X-rays comprises a pair of sensors receiving substantially simultaneously hard X-ray beam emitted from an X-ray source, one of which sensors receives the beam directly from the source and not passed through an object to be measured while the other sensor receives the beam passed through the object. The other sensor comprises an X-ray image receiving camera providing an X-ray image of the object and a spot X-ray sensor for receiving the beam passed through a restricted measuring zone or spot in the object, and the camera and spot sensor are shiftable alternately to a position of receiving the beam passed through the object, whereby, after visual observation of the X-ray image for discrimination, the restricted zone or spot can be determined for a higher precision measuring, and a precise quantitative measurement can be carried out by the spot sensor with respect to the restricted zone or spot.

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