Measuring apparatus for characterizing a surface having...

Details Measuring apparatus for characterizing a surface having... Measuring apparatus for characterizing a surface having...

G - Physics

01

J

73/55

G01J 3/36 (2006.01) G01J 3/42 (2006.01) G01N 21/47 (2006.01) G01J 3/28 (2006.01)

Patent

CA 1321896

Abstract of the Disclosure: A measuring apparatus includes a freely moving measuring head which is connected to a stationary base unit via light conductors and an electrical cable. The radiation reflected from the sample is simultaneously measured at three different angles. For this purpose, three diode-array spectrometers are provided in the stationary base unit. The spectrum of the radiation illuminating the sample can be simultaneously measured with a fourth diode-array spectrometer.

562815

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