Measuring apparatus for x-ray fluorescence analysis

Details Measuring apparatus for x-ray fluorescence analysis Measuring apparatus for x-ray fluorescence analysis

G - Physics

01

N

358/12

G01N 23/223 (2006.01)

Patent

CA 1111576

ABSTRACT OF THE DISCLOSURE The specification describes an improved measuring apparatus for X-ray fluorescence analysis wherein the specimen is stimulated by glancing incident radiation and is examined spectrometrically with a detector disposed over the specimen. A reflector, disposed in the ray path of the stimulating X-radiation is employed to deflect the radiation to the surface of the specimen. The re- flector acts as a low-pass filter to cut off the unwanted highly energetic component of the stimulating radiation and allows for the use of a much simpler and less expensive specimen support device.

309467

Affiliated with

Also associated with

Rating

Measuring apparatus for x-ray fluorescence analysis does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Measuring apparatus for x-ray fluorescence analysis, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Measuring apparatus for x-ray fluorescence analysis will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFCA-PAI-O-131103