Measuring device for a frequency analysis of signal levels...

Details Measuring device for a frequency analysis of signal levels... Measuring device for a frequency analysis of signal levels...

G - Physics

01

R

324/38

G01R 23/02 (2006.01) G01R 19/00 (2006.01) G01R 23/16 (2006.01) H04B 3/48 (2006.01)

Patent

CA 1123056

ABSTRACT The invention relates to a measuring device for a frequency anal- ysis of signal levels within a large frequency range, which is extremely fast. To this end, the measuring device comprises an intermediate-frequency amplifying arrangement having two or more selective amplifiers, each equipped with automatic amplifying control. The wide-band control loop of each ampli- fier contains essentially a controllable attenuator and a regulating ampli- fier. The band-width of the selective amplifiers, which are connected in series, is reduced in stages in the direction of the signal flow. The con- trol factors from the regulating amplifiers are added together in an adder and are fed to a signal-level-evaluating and indicating device.

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