Measuring probe for measuring high frequencies and method of...

G - Physics – 01 – R

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

G01R 1/067 (2006.01)

Patent

CA 2385337

The invention relates to a measuring probe (100) for measuring high frequencies, comprising a contact end (20) for contacting planar structures and a coaxial-cable end (18) for connecting to a coaxial cable (22), whereby a coplanar conductor structure (10) consisting of at least two conductors (12, 14) is located between the contact end (20) and the coaxial-cable end (18). A dielectric (28) which supports the coplanar conductor structure (10) is provided on at least one side, in particular both sides of the coplanar conductor structure (10) which extends over a predetermined section between the coaxial-cable end (18) and the contact end (20). Between the dielectric (28) and the contact end (20), the measuring probe (100) is configured in such a way, that the conductors (12, 14) of the coplanar conductor structure (10) are held freely in space and are mounted in an elastic manner in relation to the supporting dielectric (28).

La présente invention concerne une pointe de mesure (100) servant à la mesure de hautes fréquences, comprenant une extrémité de contact (20) destinée à être mise en contact avec des structures planes et une extrémité à câble coaxiale (18) destinée à être reliée à un câble coaxial (22). Entre l'extrémité de contact (20) et l'extrémité à câble coaxiale (18) se trouve une structure conductrice coplanaire (10) comportant au moins deux conducteurs (12, 14). Sur au moins un côté, en particulier sur les deux côtés de la structure conductrice coplanaire (10) sur une partie prédéterminée entre l'extrémité à câble coaxiale (19) et l'extrémité de contact (20) se trouve un diélectrique (28) supportant la structure conductrice coplanaire (10). Entre le diélectrique (28) et l'extrémité de contact (20), la pointe de mesure (100) est formée de sorte que les conducteurs (12, 14) de la structure conductrice coplanaire (10) se trouvent libre dans l'espace et les conducteurs du diélectrique (28) sont montés de manière élastique.

LandOfFree

Say what you really think

Search LandOfFree.com for Canadian inventors and patents. Rate them and share your experience with other people.

Rating

Measuring probe for measuring high frequencies and method of... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Measuring probe for measuring high frequencies and method of..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Measuring probe for measuring high frequencies and method of... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFCA-PAI-O-1547855

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.