G - Physics – 01 – C
Patent
G - Physics
01
C
343/6
G01C 3/08 (2006.01) G01B 11/24 (2006.01) G01S 17/46 (2006.01)
Patent
CA 1236904
Measuring system employing a measuring method based on the triangulation principle for the non-contact measurement of a distance from the surface of a contoured object to a reference level. ABSTRACT An apparatus for the rapid and accurate dimensional inspection of an object. In particular, the apparatus is adapted for the acquisition of object range data. The appa- ratus includes a source for emitting a slender beam of radiation, first beam guide means for causing the beam to impinge on a desired spot of the object under inspection, second beam guide means for causing radiation reflected from the spot of impingement to traverse a predetermined path, and a linear radiation-sensitive detector disposed in this predetermined path for receiving the reflected radiation. The second beam guide means are adapted to image focussed spots on the detector of only those object spots which are irradiated by a predetermined sectional length portion of the emitted beam of radiation. A preferred embodiment includes third beam guide means for causing radiation reflected from the spot of im- pingement to traverse a further predetermined path also leading to the detector. The second and third beam guide means are structurally different from each other in such a manner that one and the same object spot irradiated by the predetermined beam portion is imaged on the detector as two separate, focussed spots spaced a fixed distance from each other. Thereby a reliable discrimination can be made between true and false reflections from the object under inspection.
456980
Beckmann Leo H.j.f.
Oomen Gijsbert L.
Fetherstonhaugh & Co.
N. V. Optische Industrie "de Oude Delft"
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