Measuring system for a drill-hole probe

Details Measuring system for a drill-hole probe Measuring system for a drill-hole probe

G - Physics

01

N

358/3

G01N 23/02 (2006.01)

Patent

CA 1044380

Abstract of the Disclosure The present invention relates to a measuring system for a drill- hole probe using a non-dispersive X-ray fluorescence with radiation collimat- ing for element analysis. The system has a source of radiation, a detector for the X-ray fluorescence radiation and/or the Compton secondary radiation and a shield for the detector against direct radiation from the source. The source, the shield and the detector are arranged in a manner such that they can be surrounded, in cylindrical symmetry by the material adapted to be excited to X-ray fluorescence by the radiation issuing from the source. The distance between the source and the detector the source and the shield and the shield and the detector are all variably adjustable.

244587

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