Mechanized loop testing using a local metallic access port

Details Mechanized loop testing using a local metallic access port Mechanized loop testing using a local metallic access port

H - Electricity

04

M

379/2

H04M 1/24 (2006.01) H04M 3/30 (2006.01)

Patent

CA 1237208

- 20 - MECHANIZED LOOP TESTING USING A LOCAL METALLIC ACCESS PORT Abstract In a telephone loop system where loops are connected to a remote switch which in turn homes on a host switch via a carrier system and where the distance between the ends of the loops and the host switch exceeds a predetermined distance, the loops may be tested by locating the test apparatus remotely from the host switch. In order to establish a connection between the test apparatus and the loops, signals are transferred over two dedicated carrier channels between the test apparatus and the host switch via two applique circuits. These applique circuits make it appear to the test system as if the remote switch (or carrier RT or concentrator) support a test trunk interfaces. This makes it possible to use test hardware designed for use with class 5 offices with these remote units without modification to the test system itself.

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