Memory for storing response patterns in an automatic testing...

Details Memory for storing response patterns in an automatic testing... Memory for storing response patterns in an automatic testing...

G - Physics

01

R

324/70

G01R 31/302 (2006.01) G01R 31/3193 (2006.01)

Patent

CA 1280805

Title of the Invention: MEMORY FOR STORING RESPONSE PATTERNS IN AN AUTOMATIC TESTING INSTRUMENT ABSTRACT In an automatic testing instrument, to store responses educed from an equipment under test in response to stimuli sent thereto, a response memory is used. This response memory includes two serial/parallel shift registers, a buffer, a static RAM and an input/output buffer. The response memory is capable of accepting the data bits being transmitted by the equipment under test at different data rates, corresponding to either serial or parallel inputted data bits.

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