Memory test system with defect compression

Details Memory test system with defect compression Memory test system with defect compression

G - Physics

11

C

G11C 29/00 (2006.01) G01R 31/319 (2006.01) G01R 31/3193 (2006.01) G11C 29/44 (2006.01)

Patent

CA 2270917

A system for reducing or obviating the requirement for a large amount of defect capture memory in memory test and analysis systems by compressing test results. The compression system reduces or replaces the fault capture memory in the test system or workstation or both, a major cost in test systems, while providing for subsequent regeneration of the test results, either without loss, or with the loss of certain features immaterial to the application.

Cette invention porte sur un système qui permet de réduire ou de parer à l'exigence d'une grande quantité de mémoire pour stocker des éléments mémoire défectueux dans des systèmes de test et d'analyse de mémoire, par compression des résultats des tests. Le système de compression réduit ou remplace les éléments mémoire défectueux dans le système de test ou la station de travail ou les deux (un coût important dans les systèmes de test), tout en permettant une régénération des résultats des tests, soit sans perte, soit avec perte de certaines caractéristiques négligeables pour l'application.

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