H - Electricity – 01 – L
Patent
H - Electricity
01
L
356/149
H01L 21/265 (2006.01) H01L 29/167 (2006.01) H01L 29/24 (2006.01) H01L 29/78 (2006.01)
Patent
CA 1313571
METAL OXIDE SEMICONDUCTOR FIELD-EFFECT TRANSISTOR FORMED IN SILICON CARBIDE Abstract The present invention comprises a meal- oxide-semiconductor field-effect transistor (MOSFET) formed in silicon carbide. The doped source and doped drain are formed by high temperature ion implantation of dopant ions into the silicon carbide.
581146
Davis Robert F.
Kong Hua-Shuang
Palmour John W.
Finlayson & Singlehurst
North Carolina State University
LandOfFree
Metal oxide semiconductor field-effect transistor formed in... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Metal oxide semiconductor field-effect transistor formed in..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Metal oxide semiconductor field-effect transistor formed in... will most certainly appreciate the feedback.
Profile ID: LFCA-PAI-O-1303434