Method and apparatus for analyzing and detecting faults in...

G - Physics – 01 – M

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

G01M 13/04 (2006.01) G01H 1/00 (2006.01) G01M 13/02 (2006.01)

Patent

CA 2159920

The present invention provides a method and system (12) for analyzing signals from rotating machines containing rotating components that slip and, thereby, to detect faults in those components. The signals are processed (12) by a series of steps to generate coherently averaged spectra and derived features that indicate defects in, or certain other features of, machine components that slip or rotate asynchronously.

LandOfFree

Say what you really think

Search LandOfFree.com for Canadian inventors and patents. Rate them and share your experience with other people.

Rating

Method and apparatus for analyzing and detecting faults in... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method and apparatus for analyzing and detecting faults in..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and apparatus for analyzing and detecting faults in... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFCA-PAI-O-1822492

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.