G - Physics – 01 – M
Patent
G - Physics
01
M
G01M 13/04 (2006.01) G01H 1/00 (2006.01) G01M 13/02 (2006.01)
Patent
CA 2159920
The present invention provides a method and system (12) for analyzing signals from rotating machines containing rotating components that slip and, thereby, to detect faults in those components. The signals are processed (12) by a series of steps to generate coherently averaged spectra and derived features that indicate defects in, or certain other features of, machine components that slip or rotate asynchronously.
Deeth Williams Wall Llp
Monitoring Technology Corporation
LandOfFree
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