Method and apparatus for analyzing measurements

Details Method and apparatus for analyzing measurements Method and apparatus for analyzing measurements

G - Physics

06

F

G06F 17/40 (2006.01) G01D 3/028 (2006.01) G01D 21/00 (2006.01) G06F 15/00 (2006.01) G06F 17/18 (2006.01)

Patent

CA 2353817

A method, apparatus, and article of manufacture for analyzing measurements. The invention provides a method for separating and analyzing the components of a distribution, such as deterministic and random components. The method performs the steps of collecting data from a measurement apparatus, constructing a histogram based on the data such that the histogram defines a distribution, fitting tails regions wherein deterministic and random components and associated statistical confidence levels are estimated.

L'invention concerne un procédé, un appareil et un produit d'analyse de mesure. Ledit procédé permet de séparer et d'analyser les composantes d'une distribution, telles que les composantes déterministes et aléatoires. Ledit procédé comprend les étapes de collecte des données provenant des appareils de mesure, de construction d'un histogramme établi à partir des données de façon à ce que l'histogramme définisse une distribution, d'ajustement des régions de queues de distribution dans lesquelles on a calculé les composantes déterministes et aléatoires et les niveaux de fiabilité statistique qui leur sont associés.

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