Method and apparatus for analyzing sludgy materials

Details Method and apparatus for analyzing sludgy materials Method and apparatus for analyzing sludgy materials

G - Physics

01

N

358/12, 358/11.4

G01N 23/20 (2006.01) G01N 23/223 (2006.01) G01N 33/24 (2006.01)

Patent

CA 1267734

ABSTRACT OF THE DISCLOSURE The invention relates to a method and apparatus for analyzing sludgy materials by exposing the flowing material in continuous manner to x-ray radiation and by measuring the radiation thus created in the sludgy material. According to the invention, the radiation emitted from the material is measured with respect to the intensities of both x-ray fluorescence radiation and x-ray diffraction radiation, and these intensities are combined in order to form a parameter which describes the proportions of the partial components in a given compound combination. Moreover, the detectors employed in the measurement of the radiation intensities are placed at the same cross-sectional plane of the analyzer.

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