Method and apparatus for analyzing trace components using a...

Details Method and apparatus for analyzing trace components using a... Method and apparatus for analyzing trace components using a...

G - Physics

01

N

150/20, 358/9

G01N 31/04 (1980.01)

Patent

CA 1082579

ABSTRACT OF THE DISCLOSURE A method of analyzing a trace gas, in which the trace gas is transported in a carrier gas stream into a reaction chamber where the trace gas is ionized. The carrier gas includes or is a reagent gas which is ionized in the reaction chamber and the ions of which in turn form trace gas ions. The carrier gas, which is cryopumpable, is then injected with the trace gas ions into a vacuum chamber, the walls of which are cooled to cryopump the reagent gas and thus strip it away from the trace gas ions. The trace gas ions are focused into an analyzer and analyzed.

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