Method and apparatus for defect detection

Details Method and apparatus for defect detection Method and apparatus for defect detection

G - Physics

01

N

G01N 27/20 (2006.01) A61B 19/04 (2006.01) A61F 6/04 (2006.01) G01M 3/40 (2006.01)

Patent

CA 2735815

A system for detecting a defect in a membranous article (20) comprising: an emitter probe (10) connected to an electrical supply (14), said probe (10) insertable into a cavity of said article (20); a sensor (15) for receiving an electrical discharge from said probe (10); a conveyor system for bringing the probe and sensor into mutual proximity; a processor for measuring the potential difference between the probe and sensor, said processor capable of detecting a defect based upon said measurement.

La présente invention concerne un système pour la détection dun défaut dans un article de type membraneux (20) comportant: une sonde émettrice (10) connectée à une alimentation électrique (14), ladite sonde (10) étant apte à être introduite dans une cavité dudit article (20); un capteur (15) pour recevoir une décharge électrique provenant de la sonde (10); un système de transport pour le rapprochement mutuel de la sonde et du capteur; un processeur pour mesurer la différence de potentiel entre la sonde et le capteur, ledit processeur étant capable de détecter un défaut sur la base de ladite mesure.

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