Method and apparatus for detecting overlapped substrates

Details Method and apparatus for detecting overlapped substrates Method and apparatus for detecting overlapped substrates

G - Physics

01

N

G01N 21/89 (2006.01) G07D 7/12 (2006.01) B65H 7/12 (2006.01)

Patent

CA 2510943

An apparatus and method for detection of overlapped substrates, that are at least opaque, analyses a high frequency component caused by speckle for a sudden drop therein. This high frequency component drops dramatically when overlapped substrates are present and therefore allows fast accurate recognition of an overlapped substrate condition. This is useful in many applications including banknote validators.

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