Method and apparatus for determination of subsurface...

G - Physics – 01 – V

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G01V 3/08 (2006.01) G01V 3/30 (2006.01)

Patent

CA 1118045

60.427/479 Canada TO ALL WHOM IT MAY CONCERN: Be it known that We, GERALD HUCHITAL and JACQUES TABANOU, have invented an improve- ment in METHOD AND APPARATUS FOR DETERMINATION OF SUBSURFACE PERMITTIVITY AND CONDUCTIVITY of which the following is a SPECIFICATION ABSTRACT OF THE DISCLOSURE The disclosure is directed to an apparatus and method for determining the dielectric constant and/or con- ductivitv of earth formations surrounding a borehole. Electromagnetic energy is generated at a first location in the borehole. The relative attenuation and the relative phase of the electromagnetic energy are detected at second and third locations in the borehole, respectively. The third location is spaced farther from the first location than is the second location; in other words, the second location is between the first and third locations. The relative attenuation is preferably obtained from a first or "close" differential receiver at said second location and the relative phase is measured by a second or "far" differential receiver arrangement located at the third location. Means are provided for determining the dielectric constant and/or the conductivity of the formations as a function of the detected relative attenuation and relative phase. These properties are determined with improved accuracy as compared to prior art techniques because the relative attenuation and relative phase information represents the effects of formations at substantially the same depth of investigation. In a further embodiment of the invention, the relative attenuation of the electromagnetic energy is also detected at the third location and then combined with the other information to obtain an "ultra deep" conductivity value. -2-

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