Method and apparatus for determining characteristics of...

Details Method and apparatus for determining characteristics of... Method and apparatus for determining characteristics of...

G - Physics

01

V

358/3

G01V 5/12 (2006.01) E21B 49/00 (2006.01) G01V 5/08 (2006.01) G01V 11/00 (2006.01)

Patent

CA 1213080

16 ABSTRACT: In a high-frequency circuit arrangement, es- pecially passive parts of the circuit are realized in a semiconductor body in which active circuit elements of another semiconductor material are located in recesses in the semiconductor body. When it is ensured that the semi- conductor body is at least in part low-ohmic, a reference plane, for example, the ground plane, can extend very close to the elements of the circuit arrangement. Conse- quently and due to the shorter connections, parasitic effects are considerably reduced. When only one active element is mounted and only connections for this element are formed on the semiconductor body, a very suitable support for mounting and measurement is obtained.

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